Origins of X-rays; classical X-ray sources; synchrotron radiation. Effects of X-rays passing through solid material: X-ray diffraction, absorption, fluorescence, Compton effect; applications. Neutron diffraction, electron diffraction; comparison with X-ray diffraction. X-ray devices for examination of structural properties of materials. Geometry and construction of devices for X-ray diffraction; application of classical and modern X-ray devices in structural studies. Photographic techniques; types of cameras, crystal rotation and oscillation practice, identification of diffraction maxima. Diffractometer techniques. Detection and recording of X-rays. X-ray detectors and counters; classical and advanced detectors. Crystallization techniques. Selection of single-crystal sample for diffraction examination. Work with unstable materials. Analysis and interpretation of X-ray diffraction data from single crystal; precision and accuracy in determination of unit-cell parameters, symmetry and crystal structure. Strategies for structure solution from polycrystalline samples. Powder pattern fitting methods in crystal structure examination: individual profile fitting method, whole powder pattern decomposition method, Rietveld method; precision and accuracy. Structural analysis of amorphous materials; radial distribution function. X-ray scattering in amorphous material, EDXD method, EXAFS method. Radiation protection and security measures. Dosimetry.
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- OBVEZNA LITERATURA:
C. Giacovazzo, H. L. Monaco, D. Viterbo, F. Scordari, G. Gilli, G. Zanotti, M. Catti: Fundamentals of Crystallography, Oxford University Press Inc., New York, 1992.
C. Hammond: The basic of crystallography and diffraction, Oxford University Press, New York, 2001.
W. I. F. David, K. Shankland, L. B. McCusker, Ch. Baerlocher: Structure determination from powder diffraction dana, Oxford University Press , New York, 2002.
R. A. Young (ur.): The Rietveld Method, IUCR Monographs on Crystallography 5, Oxford University Press, Oxford 1993.
M. Thoms, H. Burzlaff, A. Kinne, J.Lange, H. Von Seggern, R. Spengler, A. Winnacker: An Improved X-Ray Image Plate Detector for Diffractometry, Proc. of the EPDIC IV, Trans. Tech. Publications, Aedermannsdorf 1996.
- DOPUNSKA LITERATURA:
revijalni članci i znanstvene monografije
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