COURSE CONTENT:
Properties of solids. Methods for characterizing solids and their applications: elemental analysis, spectroscopic methods, thermal analysis, X-ray diffraction methods, microscopy methods. Sample preparation. Crystallization and methods of growth of single crystals. Spectroscopy methods: IR spectroscopy, Raman spctroscopy, UV/VIS spectroscopy, X-ray fluorescence method. Thermal analysis: thermogravimetry, differential thermal analysis, differential scanning calorimetry. X-ray diffraction of single crystal, structural analysis of newly prepared materials. X-ray diffraction of polycrystalline materials: qualitative and quantitative phase analysis, small-angle X-ray scattering. Characterization of thin films using X-ray technique. Neutron diffraction. Microscopy: optical microscopy, transmission electron microscopy (TEM), scanning electron microscopy (SEM). Seminar: application of different analytical methods for the characterization of solids in typical environment (industry, research laboratory).
LEARNING OUTCOMES:
By the end of this course students will be able to:
1. recognize and explain the similarities and differences among different classes of solid state compounds
2. understand the ways of interaction between light and matter
3. accept theoretical base of different analytical techniques for the characterization of solids
4. select appropriate analytical technique according to the specifications of analytical problem
5. estimate advantages and disadvantages of different techniques
6. carry out meaningful interpretation of data measurements
7. apply different instrumental methods for the characterization of solids in typical environment (industry, research institutions)
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