1. komponenta

Lecture type	Total
Lectures	6
Exercises	10

* Load is given in academic hour (1 academic hour = 45 minutes)

Use of electron microscopy and diffraction in the physics of materials, biophysics and chemistry. Basic models of electron microscopes: scanning electron microscope, environmental scanning electron microscope. Transmission electron microscope with electron diffraction and high resolution electron microscope. Interpretation of transmission electron micrographs and diffraction of polycrystals, single crystals and amorphous samples. Defect characterization from the dark-field and bright-field images. Phase contrast. High resolution images. Observation of defects in the high resolution images and Z-contrast with structural resolution below 0.1 nm. Latest developments: determination of oxygen sites and bonds in the cuprates, crystal structure determination from the electron microscope image. Atomic scale imaging of the individual atoms doped in silicon. Investigation of nanocrystalline materials. Structure factor determination from the high-resolution image and from the electron diffraction. Application of the Rietveld method on the electron diffraction image of nanocrystalline materials. Miller indices determination from the electron diffraction image. Visit to the Laboratory for microstructural characterization of the Department of Physics and presentation of the basis of operating the high-resolution transmission electron microscope.

1. D.B. Williams and C.B. Carter, Transmission Electron Microscopy, A Textbook for Materials Science, PlenumPress, New York 1996.
2. J.J. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy , C. Fiori, E. Lihshin, Electron Microscopy and X- ray Microanalysis, Plenum Press, New York / London, 1984.
3. J.J. Bozzola, L.D. Russell, Electron microscopy, Jones & Bartlett Publishers Canada, Toronto, 1992.

Biofizika - izborni predmeti 1 - Regular study - Biophysics